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RESEARCH PAPERS

Changes of Internal Stress in Solid-Oxide Fuel Cell During Red-Ox Cycle Evaluated by In Situ Measurement With Synchrotron Radiation

[+] Author and Article Information
Hirofumi Sumi1

Fundamental Research Department, TOHO GAS Co. Ltd., Shinpo-Machi, Tokai 476-8501, Japanhsumi@tohogas.co.jp

Kenji Ukai, Misuzu Yokoyama, Yasunobu Mizutani

Fundamental Research Department, TOHO GAS Co. Ltd., Shinpo-Machi, Tokai 476-8501, Japan

Yoshihisa Doi, Shutaro Machiya, Yoshiaki Akiniwa, Keisuke Tanaka

Department of Mechanical Engineering, Nagoya Univ. Chikusa-ku, Nagoya 464-8603, Japan

1

Corresponding author

J. Fuel Cell Sci. Technol 3(1), 68-74 (Jul 20, 2005) (7 pages) doi:10.1115/1.2134739 History: Received May 13, 2005; Revised July 20, 2005

The internal stress in anode-supported solid-oxide fuel cells (SOFCs) was evaluated by in situ measurement using high-energy x-ray synchrotron radiation. The oxidized cell had a compression of 400MPa in the c-ScSZ electrolyte thin film and a tension of 50–100 MPa in the NiO-YSZ anode substrate at room temperature. The internal stress decreased with increasing temperature, becoming approximately zero at 1000 K. Although the internal stress returned to its initial value after the thermal cycle, the stress decreased to 200MPa in the electrolyte after the reduction cycle because of the decrease of the coefficient of thermal expansion mismatch between the electrolyte and anode. The red-ox cycle would be detrimental for anode-supported SOFC.

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Copyright © 2006 by American Society of Mechanical Engineers
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Figures

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Figure 1

Cross section and microstructures of unit cell. Electrolyte is fully dense and anode is porous structure.

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Figure 2

Experimental setup for stress measurement at SPring-8 BL02B1

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Figure 3

Change of x-ray penetration depth with sin2ψ. Dotted and solid lines refer to theoretical penetration depth at 71.91 keV with side- and iso-inclination methods, respectively. Symbols show experimental condition in this study.

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Figure 4

2θ-sin2ψ diagram for c-ScSZ with Cu-Kα radiation at room temperature

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Figure 5

Changes of internal stress in c-ScSZ with Cu-Kα radiation at room temperature

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Figure 6

XRD spectra obtained using constant-penetration-depth method at 300 and 1000 K; τ=20μm

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Figure 7

2θ-sin2ψ diagram for c-ScSZ with increasing temperature in an air atmosphere

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Figure 8

Changes of internal stress in c-ScSZ and NiO against temperature in an air atmosphere

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Figure 9

XRD spectra obtained at 300, 800, and 1000 K; τ=37μm

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Figure 10

2θ-sin2ψ diagram for c-ScSZ with decreasing temperature in a reducing atmosphere

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Figure 11

Changes of internal stress in c-ScSZ and NiO against temperature in a reducing atmosphere

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Figure 12

Temperature dependence of thermal expansion and coefficient of thermal expansion (CTE) for electrolyte and anode

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Figure 13

Internal stress calculated from thermal expansion data using Eq. 14

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