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Research Papers

Surface-to-Surface Radiation Exchange Effects in a 3D SOFC Stack Unit Cell

[+] Author and Article Information
Gianfranco DiGiuseppe

Kettering University,
1700 University Avenue,
Flint, MI 48504-4898
e-mail: gdigiuse@kettering.edu

Contributed by the Advanced Energy Systems Division of ASME for publication in the JOURNAL OF FUEL CELL SCIENCE AND TECHNOLOGY. Manuscript received August 23, 2012; final manuscript received September 19, 2012; published online November 16, 2012. Editor: Nigel M. Sammes.

J. Fuel Cell Sci. Technol 9(6), 061007 (Nov 16, 2012) (9 pages) doi:10.1115/1.4007816 History: Received August 23, 2012; Revised September 19, 2012

This paper reports a new study where radiation effects are studied in details in an SOFC stack. The 3D model used includes and couples fluid dynamics, electrochemistry, electrical conduction, diffusion, and heat transfer physics. The model was built using in-house experimental voltage-current density data for validation purposes. The objective of this study is to understand the effects of radiation in the flow channels of SOFC stacks. Both gas radiation and surface-to-surface heat exchange are considered. This study indicates that gas radiation is negligible when compared to surface-to-surface heat exchange. It is also found that surface-to-surface heat exchange cannot be neglected and actually provides a more uniform temperature distribution along the SOFC stack. Heat transfer via convection is also significant and should be included when modeling similar situations. Finally, the model indicates that viscous dissipation is a negligible source of heat generation.

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References

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Figures

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Fig. 2

Dimension labels for the unit cell and mesh used in this work. The mesh number of axial element was varied until the solution had become independent.

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Fig. 1

Repeating SOFC unit in a stack and unit cell chosen for this study

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Fig. 3

Model validation using isothermal experimental voltage-current density data and unit cell voltage-current density curve for a length of 0.1 ms for nonisothermal conditions

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Fig. 4

Sample of a typical temperature distribution along the unit cell

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Fig. 10

Temperature profiles with radiation ɛanode,cathode = 0.01 (an/el interface) along the unit cell at different voltages

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Fig. 11

Temperature profiles with radiation ɛanode,cathode=0.1 (an/el interface) along the unit cell at different voltages

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Fig. 12

Temperature profiles with viscous dissipation at the an/el interface along the unit cell at different voltages

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Fig. 13

Temperature profiles without convection/viscous dissipation at the an/el interface along the unit cell at different voltages

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Fig. 5

Sample of typical velocity distribution and velocity vectors along the unit cell

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Fig. 6

Temperature profiles without radiation at the an/el interface along the unit cell at different voltages

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Fig. 7

Temperature profiles with radiation at the an/el interface along the unit cell at different voltages

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Fig. 8

Temperature profiles along the unit cell at different locations at 0.6 Vs

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Fig. 9

Percent error in temperature at the an/el interface along the unit cell at 0.6 Vs

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