Research Papers

Corrosion Resistance of SOFC and SOEC Glass-Ceramic Seal Materials in High Temperature Steam/Hydrogen

[+] Author and Article Information
Paul J. Howard

 Alstom Grid Research and Technology, St. Leonard’s Avenue, Stafford, ST17 4LX, UKpaul.howard@alstom.com

Iwona Szkoda1

 Alstom Grid Research and Technology, St. Leonard’s Avenue, Stafford, ST17 4LX, UK

Kratos Axis Ultra DLD imaging XPS

Cameca ims 4f


Orton Ceramic Foundation, 1000D.

J. Fuel Cell Sci. Technol 9(4), 041009 (Jun 19, 2012) (4 pages) doi:10.1115/1.4006794 History: Received February 02, 2011; Revised April 11, 2012; Published June 19, 2012; Online June 19, 2012

There exists concern that glass-ceramic seal materials may not tolerate the high temperature gaseous environment in solid oxide fuel cell (SOFC) and solid oxide electrolysis cell (SOEC) applications, potentially leading to the poisoning of electrodes by silica and ultimate loss of hermeticity. A mechanism for the loss of silicon from glass seals has been proposed by other workers. To address this concern, material samples of proprietary glass-ceramics were exposed to steam/hydrogen atmospheres at 800 °C for up to 1000 h. The mass losses of the samples were measured at intervals and their changes in surface chemistry were analyzed using techniques such as X-ray photoelectron spectroscopy and dynamic secondary ion mass spectroscopy. It was shown that the extent of corrosion depends on composition and surface microstructure and that some glass-ceramics are particularly resistant to steam/hydrogen corrosion.

Copyright © 2012 by American Society of Mechanical Engineers
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Grahic Jump Location
Figure 1

Thermal expansion characteristics of two Alstom-proprietary glass-ceramic seals, compared with Crofer® 22 APU ferritic stainless steel (ThyssenKrupp AG) and an InDec anode-supported cell

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Figure 2

Arrhenius plot of the temperature variation of volume resistivity of selected Alstom-proprietary glass-ceramics, compared with commercially-available ceramics

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Figure 3

Normalized mass loss versus time of exposure



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