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Keywords: electron backscattering
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Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Eng. Gas Turbines Power. November 2009, 131(6): 062904.
Published Online: July 17, 2009
... electron microscope (SEM) electron backscatter analysis. Rietveld analysis using X-ray diffraction is presently the only reliable method to quantify the polytypes in the SiC layer. It was found that the SiC layer consists predominantly (82–94%) of the 3C polytype, with minor amounts of the 6H and 8H...
